Collaborator Facilities
Alabama A&M University
- 2.1 and 1.7 MeV accelerators for materials analysis and implant
- SEM, XPS, ISS, SAM
Advanced Photon Source
- Surface X-ray diffraction @ µ-CAT beamline
- 6 circle diffractometer
- Beamline energy 16.2keV
Commissariat à l'Energie Atomique, France
- LLEM
- ARPES
- PES
- MicroXPS
Centre National de la Recherche Scientifique, France
- STM
- High B Field Lab
- X-ray Diffraction (ESRF)
- IR Spec
- Raman
- Theory
Laboratorio Nacional de Luz Sincrotron, Brazil
- SEM
- TEM
MIT, Lincoln Lab
- NanoLithography
- Device Fabrication Lab
- Device Testing
National Institute of Standard and Technology
- Low T STM
- Magnetic STM (ST)
- MBE
- Theory
Oak Ridge National Laboratory
- STEM
University of California, Berkeley
- ARPES
- Inelastic X-ray Scattering
UCR
- Graphene Chemistry
University of Michigan
- Ultrafast spectroscopy at THz, mid-IR, visible, and near-UV
- Combined THz and optical spectroscopy
This material is based upon work supported by the MRSEC Program of the National Science Foundation No. DMR 0820382. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of NSF.